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authorPeiyang He <peiyang_he@smail.nju.edu.cn>2026-11-06 19:52:52 +0800
committerJason Gunthorpe <jgg@nvidia.com>2026-11-10 17:24:15 -0400
commita12337013fcaf6eea29dce8409b84bd4588f7801 (patch)
tree35d28885ce5fca536b3b7789cc5183b53d600cf9 /scripts/Makefile.thinlto
parente6c489f40f10cc80b9baee3e6b59682bd26f3c60 (diff)
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iommufd/selftest: Fix leaked PASIDs on device teardown
The selftest mock device teardown only detaches IOMMU_NO_PASID. If userspace attaches a non-default PASID with IOMMU_TEST_OP_PASID_ATTACH and never issues IOMMU_TEST_OP_PASID_DETACH, the attachment keeps the reference taken by iommufd_device_attach(). Unbind then fails and the iommufd device and IOMMU group are leaked, triggering: WARNING: drivers/iommu/iommufd/iommufd_private.h:241 at iommufd_device_unbind+0x80/0xb0 WARNING: drivers/iommu/iommu.c:744 at __iommu_group_free_device+0x1b2/0x400 WARNING: drivers/iommu/iommufd/main.c:389 at iommufd_fops_release+0x380/0x3b0 WARNING: drivers/iommu/iommufd/main.c:399 at iommufd_fops_release+0x3a3/0x3b0 Track attached PASIDs in an IDA, as VFIO does, and detach them all before detaching IOMMU_NO_PASID and unbinding the mock device. Fixes: c1b52b0a97ae ("iommufd/selftest: Add test ops to test pasid attach/detach") Signed-off-by: Peiyang He <peiyang_he@smail.nju.edu.cn> Link: https://patch.msgid.link/CD846EC67F4302A7+20261106115252.87749-1-peiyang_he@smail.nju.edu.cn Signed-off-by: Jason Gunthorpe <jgg@nvidia.com>
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